United States Department of Transportation
i
Implementation of AIMS in measuring aggregate resistance to polishing, abrasion, and breakage.
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2014-05-01
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Abstract:The feasibility of using the Micro-Deval apparatus along with the second-generation Aggregate Imaging System
(AIMS) to develop a procedure for measuring aggregate polishing resistance, and to measure aggregate shape
properties was investigated. Eleven aggregate sources from the state of Illinois and neighboring states were
selected to develop an aggregate polishing experimental procedure using AIMS and Micro-Deval. AIMS was
used to measure aggregate shape properties with a special focus on aggregate angularity and surface texture,
while Micro-Deval provided the needed polishing/degradation. Mathematical, statistical, and rate of texture loss
analysis indicated that all aggregate sources reached terminal texture at 210 minutes or less. Aggregate
angularity followed the same trend, and terminal angularity was achieved at 210 minutes or less. As the polishing
procedure was finalized, aggregate shape properties were tested for 77 aggregate sources. Shape properties
were measured before polishing and after polishing in Micro-Deval at 105 and 210 minutes, and a database was
developed using Microsoft Excel. The research team also studied the number of aggregate particles that must be
scanned in AIMS. Random sub-sampling and asymptotic analyses were conducted and it was concluded that
120 particles were required. This finding was further evaluated by manual sampling of 120 aggregate particles.
The manual sampling proved that 120 particles were enough for AIMS angularity and texture measurements.
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